The Micron Wave

Elevating precision soft, orthokeratology, and rigid corneal lens fitting

Eef van der Worp Randy Kojima Matthew Lampa FBCLA, FSLS, FIAO

Contact Lens Spectrum September 1, 2025 Vol 40, Issue September 2025 Page(s): 12-14,16-18

Eef van der Worp

Specialties: Contact lens fitting

Bio: Eef van der Worp, BSc, PhD, writes on contact lens design and fitting for Contact Lens Spectrum. In the September 2025 article “The Micron Wave,” van der Worp discussed precision fitting across soft, orthokeratology, and rigid corneal lenses, with emphasis on sagittal height, micron-level measurement, and the role of axial length and choroidal thickness metrics in myopia management.

Randy Kojima

Specialties: Specialty contact lenses

Bio: Randy Kojima, FAAO, FBCLA, FSLS, FIAO, writes on specialty contact lens fitting, including precision approaches to soft lenses, orthokeratology lenses, and rigid corneal lenses. His Contact Lens Spectrum work addresses evolving terminology and measurement concepts in contact lens fitting, including sagittal height and micron-scale assessment in modern lens design.

Matthew Lampa

Specialties: Contact lens fitting

Bio: Matthew Lampa, OD, is an optometrist whose Contact Lens Spectrum authorship focuses on contact lens fitting, including precision soft lens, orthokeratology, and rigid corneal lens applications. His recent professional writing addresses evolving terminology and measurement concepts in contact lens practice, including sagittal height, micron-level assessment, and their relevance across modern lens modalities.

FBCLA, FSLS, FIAO

Specialties: Contact lens fitting

Bio: This author contributed to a Contact Lens Spectrum article on precision fitting for soft, orthokeratology, and rigid corneal lenses, with discussion of sagittal height, micron-scale measurement, and evolving terminology in contact lens practice.

PentaVision

Contact Lens Spectrum

The Micron Wave

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